Abstract: The paper presents a test calculation principle which serves for producing tests of transistor-level faults in CMOS digital circuits. The considered fault model includes stuck-at-0/1 logic ...

Field-effect transistors ... than one in the PTL circuits, PTL/CMOS hybrid circuits are constructed with signal gains that are not possible with pure PTL circuits, making it feasible to construct ...

The findings show how to use the material also to make "N-type" transistors. Because both types of transistors are needed for CMOS circuits, the findings point to possible applications for ...

Researchers at UC Santa Barbara have introduced and modelled an integrated circuit design scheme in which transistors ... According to the university, bulk materials commonly used to make CMOS ...