A two-part series that covers the basics of power supply design in the context of industrial functional safety.

This paper investigates the Single-Event Burnout (SEB) effect in thin irradiated PiN diodes and Low-Gain Avalanche Diodes, LGAD. SEB is a destructive event triggered in silicon sensors by the passage ...

Get article recommendations from ACS based on references in your Mendeley library. Pair your accounts.

State Key Laboratory of Fine Chemicals, Frontiers Science Center for Smart Materials Oriented Chemical Engineering, Dalian University of Technology, Dalian 116024, China ...

Hello, @MartyG-RealSense thank you for your help! I double-checked the metadata, and I noticed that the difference between sensor_timestamp and frame_timestamp is roughly equal to half the exposure ...

About This repository contains the code and documentation for our final year engineering project "Smart Seed Sowing System", developed using the ESP8266 NodeMCU microcontroller. The aim of the project ...